| Material | Ea (eV) | n |
|---|---|---|
| Aluminum | 0.5-0.7 | 1-2 |
| Copper | 0.7-1.0 | 1-2 |
| Silver | ~0.6 | 1-2 |
MTTF (hrs): 725.4242
Black's equation models electromigration — the gradual failure of metal interconnects as current physically displaces atoms over time. Mean time to failure falls as current density rises and as temperature rises:
where J is current density, nis the current-density exponent (typically 1–2), Ea is activation energy (eV), kis Boltzmann's constant, and T is temperature in kelvin.
Example:With n = 2, doubling current density cuts life to one-quarter (AF = 2² = 4). Separately, raising temperature from 105 °C to 150 °C at Ea = 0.9 eV gives a thermal acceleration of about 19×. The two effects multiply, so current and temperature together drive electromigration life hard.
Use this when sizing metal traces, vias, or bond wires for long-term current loading. For thermally activated chemical wear-out, see the Arrhenius calculator.